A thin slice of conducting material is placed normal to a uniform magnetic field, as shown in Fig. 8.1. [Figure 8.1] The magnetic field is normal to face CDEF and to face PQRS. The current I in the slice is normal to the faces CDQP and FERS. A potential difference, the Hall voltage VH, is developed across the slice.
- (a)(i)State the faces between which the Hall voltage VH is developed. .............................. and ..............................[1]
- (a)(ii)Explain why a constant voltage VH is developed between the faces you have named in (i).[4]
- (b)Two slices have similar dimensions. One slice is made of a metal and the other slice is made of a semiconductor material. For the same values of magnetic flux density and current, state which slice, if either, will give rise to the larger Hall voltage. Explain your reasoning.[2]
This question uses a diagram from the original paper, which isn't shown here. Open the full paper from the past papers archive to see it.
Mark scheme
Marking points from the official mark scheme (Oct/Nov 2017). The mark or mark type is shown in brackets.
- [1] (a)(i) DERQ and CFSP
- [1] (a)(ii) charge carriers moving normal to (magnetic) field
- [1] (a)(ii) charge carriers experience a force normal to I (and B)
- [1] (a)(ii) charge build-up sets up electric field across the slice or build-up of charges results in a p.d. across the slice
- [1] (a)(ii) charge stops building up/VH becomes constant when FB = FE
- [1] (b) VH inversely proportional to n/number density of charge carriers
- [1] (b) number density of charge carriers (n) lower in semiconductors so VH larger for semiconductor slice or VH proportional to v/drift velocity / (for same current) drift velocity (v) higher in semiconductors so VH larger for semiconductor slice
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